Elsevier · Wang, Wu, Wen: VLSI Test Principles and Architectures, 1st Edition

Welcome

Welcome to the website for Wang, Wu, Wen: VLSI Test Principles and Architectures: Design for Testability, 1st Edition.

VLSI Test Principles and Architectures

About this companion site

This site contains software for the purchaser of the book to access and download.

Solutions

Binary Software

The binary software includes the fault simulation, test generation, boundary-scan, memory BIST, and logic BIST software and demo cases. Please download and read the Overview file before beginning.

Overview (113KB Adobe Acrobat file)
TS VS 2006.tar (5875KB .gz File)
TBSD 2006.tar (1514KB .gz File)
TMBIST 2006.tar (648KB .gz File)
TLBIST 2006.tar (5479KB .gz File)

Lecture Slides

Chapter 01 INTRO (234KB Adobe Acrobat file)
Chapter 02 DFT (497KB Adobe Acrobat file)
Chapter 03 LFSIM (771KB Adobe Acrobat file)
Chapter 04 ATPG (614KB Adobe Acrobat file)
Chapter 05 LBIST (743KB Adobe Acrobat file)
Chapter 06 Compression (423KB Adobe Acrobat file)
Chapter 07 Diagnosis (991KB Adobe Acrobat file)
Chapter 08 MBIST (875KB Adobe Acrobat file)
Chapter 09 MBISR (925KB Adobe Acrobat file)
Chapter 10 BSCAN 1500 (844KB Adobe Acrobat file)
Chapter 11 AMS (871KB Adobe Acrobat file)
Chapter 12 Trends (2187KB Adobe Acrobat file)

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