Elsevier · Wang, Wu, Wen: VLSI Test Principles and Architectures, 1st Edition · Welcome


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Welcome to the website for Wang, Wu, Wen: VLSI Test Principles and Architectures: Design for Testability, 1st Edition.

VLSI Test Principles and Architectures

About this companion site

This site contains software for the purchaser of the book to access and download.


Binary Software

The binary software includes the fault simulation, test generation, boundary-scan, memory BIST, and logic BIST software and demo cases. Please download and read the Overview file before beginning.

Lecture Slides


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